Transcend TS32MLD64V5F Fiche technique télécharger pdf (Page 9)

184PIN DDR500 Unbuffered DIMM

256MB With 32Mx8 CL3

Transcend Information Inc.

Control &Address input pulse width for each input tIPW 2.2 ns 9

Refresh interval time tREF 7.8

Output DQS valid window TQH tHP-tQHS ns 12

Clock half period tHP tCLmin/tCHmin ns 11,12

Data hold skew factor tQHS

0.5

ns 12

Auto Precharge write recovery + precharge time tDAL - - ns 14

Exit self refresh to non-read command tXSNR 75

Exit self refresh to read command tXSRD 200

1.VID is the magnitude of the difference between the input level on CK and the input level on CK.

2. The value of VIX is expected to equal 0.5*VDDQ of the transmitting device and must track variations in the

dc level of the same.

3. tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters

are not referenced to a specific voltage level but specify when the device output in no longer driving (HZ), or

begins driving (LZ).

4. The maximum limit for this parameter is not a device limit. The device will operate with a greater value for

this parameter, but sys tem performance (bus turnaround) will degrade accordingly.

5. The specific requirement is that DQS be valid (HIGH, LOW, or at some point on a valid transition) on or

before this CK edge. A valid transition is defined as monotonic and meeting the input slew rate specifications

of the device. When no writes were previously in progress on the bus, DQS will be transitioning from High-Z

to logic LOW. If a previous write was in progress, DQS could be HIGH, LOW, or transitioning from HIGH to

LOW at this time, depending on tDQSS.

6. A maximum of eight AUTO REFRESH commands can be posted to any given DDR SDRAM device.

7. For command/address input slew rate ≥ 0.5 V/ns

8. For CK & CK slew rate ≥ 0.5 V/ns

9. These parameters guarantee device timing, but they are not necessarily tested on each device. They may be

guaranteed by device design or tester correlation.

10. Slew Rate is measured between VOH(ac) and VOL(ac).

11. Min (tCL, tCH) refers to the smaller of the actual clock low time and the actual clock high time as provided

to the device (i.e. this value can be greater than the minimum specification limits for tCL and tCH).....

For example, tCL and tCH are = 50% of the period, less the half period jitter (tJIT(HP)) of the clock source,

and less the half period jitter due to crosstalk (tJIT(crosstalk)) into

12. tQH = tHP - tQHS, where: tHP = minimum half clock period for any given cycle and is defined by clock high

or clock low (tCH, tCL). tQHS accounts for 1) The pulse duration distortion of on-chip clock circuits; and 2)

The worst case push-out of DQS on one transition followed by the worst case pull-in of DQ on the next

transition, both of which are, separately, due to data pin skew and output pattern effects, and p-channel to

n-channel variation of the output drivers.

13. tDQSQ:Consists of data pin skew and output pattern effects, and p-channel to n-channel variation of the

output drivers for any given cycle.

14. tDAL = (tWR/tCK) + (tRP/tCK)

15. In all circumstances, tXSNR can be satisfied using tXSNR=tRFCmin+1*tCK

Note:

16. The only time that the clock frequency is allowed to change is during self-refresh mode.

1 2 3 4 5 6 7 8 9 10 11 12

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